METROLOGY 1, 2, 3
Serial Number: 76128400
Word Mark: METROLOGY 1, 2, 3
Goods and Services: (ABANDONED) IC 009. US 021 023 026 036 038. G & S: Metrology tool for optically measuring properties of semiconductor wafers at various stages during fabrication of semiconductor devices, including an optical sensor, a wafer-support stage, electronic data processing means, and mechanical and software interfaces for integration with wafer-loading tools and wafer-processing tools
Mark Drawing Code: (1) TYPED DRAWING
Filing Date: 09/15/2000
Current Basis: 1B
Original Filing Basis: 1B
Disclaimer: NO CLAIM IS MADE TO THE EXCLUSIVE RIGHT TO USE "METROLOGY" APART FROM THE MARK AS SHOWN
Type of Mark: TRADEMARK
Register: PRINCIPAL
Live/Dead Indicator: DEAD
SiteNo: 10361