IC 009. US 021 023 026 036 038. G & S: Computer software for use in processing semiconductor wafers; Electronic imaging platforms in the field of inspection of semiconductor materials, namely semiconductor wafers and reticles; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; Semiconductor chips; Semiconductor devices
26.05.28 - Miscellaneous designs with overall triangular shape; Triangular shape (miscellaneous overall shape)
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